Introduction

This document, 'JEM-X Analysis User Manual', has been written to help you with the JEM-X specific part of the INTEGRAL Data Analysis.

You will find some text in blue along this manual: it is used to notify a difference with respect to the previous version of this document, or the introduction of a new section (in this case only the title is marked in blue).

A more general overview on the INTEGRAL Data Analysis can be found in the 'Introduction to the INTEGRAL Data Analysis' [1]. For the JEM-X analysis scientific validation report see [3]

The 'JEM-X Analysis User Manual' is divided into two major parts:

• Description of the Instrument
  This part, based to some extent on the JEM-X User Manual [2], introduces the INTEGRAL on-board X-Ray Monitor (JEM-X).
• Description of the Data Analysis
  This part starts with an overview describing the different steps of the analysis. Then, in the Cookbook Section, several examples of analysis and their results and the description of the parameters are given.

  Finally, the used algorithms are described. A list of the known limitations of the current release is also provided.

In the Appendix of this document you find the description of the Raw and Prepared Data and also the description of the Scientific Products.